Premium
Modeling absorption of rough interface between dielectric and conductive medium
Author(s) -
Gu Xiaoxiong,
Tsang Leung,
Braunisch Henning,
Xu Peng
Publication year - 2007
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.22023
Subject(s) - microwave , lossy compression , dielectric , absorption (acoustics) , rough surface , transfer matrix method (optics) , electrical conductor , surface (topology) , computational physics , perturbation (astronomy) , plane wave , optics , materials science , mathematical analysis , mathematics , physics , optoelectronics , geometry , composite material , quantum mechanics , statistics
The effects of a random rough surface between dielectric and lossy conductive medium on power absorption are analyzed by considering incident plane waves impinging on the interface. We use two methods to formulate and solve the 2‐D problem: the two‐media small perturbation method to second order (SPM2) and the numerical system transfer operator matrix method, referred to as T‐matrix method. The two methods are in agreement within the regimes of validity. The results show significant difference between absorption of a rough surface and that of a smooth surface. Surface fields are further examined numerically. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 7–13, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22023