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Perturbation analysis of fiber surface plasma resonance sensor
Author(s) -
Sun F. G.,
Zhang Z. Y.,
Xiao G. Z.,
Lu Z. G.
Publication year - 2006
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.21956
Subject(s) - wavelength , perturbation (astronomy) , microwave , resonance (particle physics) , plasma , physics , dielectric , optics , computational physics , atomic physics , optoelectronics , quantum mechanics
Perturbation method is used to calculate the resonance wavelength shift and the sensitivity of fiber surface plasma resonance sensor. We show that the resonance wavelength always shifts to long wavelength direction as the sensed medium dielectric index increases. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 2425–2427, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21956