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De‐embedding intrinsic parameters of high‐ Q dielectric resonators from noisy measurements
Author(s) -
Naishadham Krishna
Publication year - 2006
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.21730
Subject(s) - resonator , noise (video) , coupling (piping) , microwave , calibration , embedding , electronic engineering , physics , measure (data warehouse) , dielectric resonator , dielectric , computational physics , optics , computer science , engineering , optoelectronics , quantum mechanics , mechanical engineering , database , artificial intelligence , image (mathematics)
The low losses of electromagnetically coupled dielectric resonators render the measured scattering parameters very sensitive to background “noise” contributed by the coupling mechanism, package modes, radiation, and so forth. It becomes important to properly calibrate out this parasitic influence in order to accurately measure the unloaded Q . We report a robust software calibration procedure based on a state‐space spectral estimation method, which filters out the background noise and facilitates linear extraction of the unloaded Q . © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 1453–1458, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21730