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A metamaterial‐scanning near‐field optical microscope
Author(s) -
Cory H.,
Hao Y.,
Parini C. G.
Publication year - 2006
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.21415
Subject(s) - finite difference time domain method , metamaterial , optics , microwave , microscope , slab , resolution (logic) , near and far field , slit , materials science , optical microscope , physics , computer science , scanning electron microscope , quantum mechanics , artificial intelligence , geophysics
A metamaterial‐scanning near‐field optical microscope is proposed to study a subwavelength object consisting of a pair of long slits. The device comprises a metamaterial slab adjacent to the object and a subwavelength probe consisting of a single long slit which slides along the other side of the slab. A finite‐difference time‐domain (FDTD) simulation is performed, which provides the field‐intensity contours outside the device. It is found that by using two slabs of different widths (with and without probe), in the cases considered, the resolution is better when the probe is present. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 587–590, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21415