Construction of an RF‐band test fixture model using 3‐D field simulator

For design and characterization of packaged RF‐band transistor amplifiers, test fixtures consisting of coaxial connectors and planar‐type transmission lines are frequently used. We present a method of extracting 3D field simulation parameters of these test fixtures and demonstrate that a circuit model of the test fixtures can be constructed by pure 3D field simulation using the extracted material constants. The developed circuit model predicts measurement results within 0.5 dB. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 498–500, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21390