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Construction of an RF‐band test fixture model using 3‐D field simulator
Author(s) -
Kim KiHyuk,
Kim GyoungBum,
Cha Seung Yong,
Hwang SungWoo
Publication year - 2006
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.21390
Subject(s) - test fixture , fixture , engineering , microwave , planar , amplifier , electronic circuit simulation , electronic engineering , coaxial , monolithic microwave integrated circuit , field (mathematics) , electrical engineering , mechanical engineering , computer science , electronic circuit , telecommunications , computer graphics (images) , mathematics , cmos , pure mathematics
For design and characterization of packaged RF‐band transistor amplifiers, test fixtures consisting of coaxial connectors and planar‐type transmission lines are frequently used. We present a method of extracting 3D field simulation parameters of these test fixtures and demonstrate that a circuit model of the test fixtures can be constructed by pure 3D field simulation using the extracted material constants. The developed circuit model predicts measurement results within 0.5 dB. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 498–500, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21390

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