Effect of back‐plane distance on mutual coupling between CPW‐FED slots on conductor‐backed two‐layer substrates | Zendy

Jacobs J. P. | Zendy; Joubert J. | Zendy; Odendaal J. W. | Zendy

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Effect of back‐plane distance on mutual coupling between CPW‐FED slots on conductor‐backed two‐layer substrates

Author(s) -

Jacobs J. P.,

Joubert J.,

Odendaal J. W.

Publication year - 2005

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.21184

Subject(s) - conductor , admittance , microwave , coplanar waveguide , plane (geometry) , coupling (piping) , layer (electronics) , electrical engineering , ground plane , materials science , electrical impedance , telecommunications , engineering , geometry , composite material , mathematics , antenna (radio)

The effect of back‐plane distance on the mutual admittance between twin coplanar waveguide (CPW)‐fed slots on conductor‐backed two‐layer substrates with an air bottom layer was investigated. Distances of λ o /6 and λ o /4 yielded significantly increased mutual coupling over the case of no back plane. Measurements supporting the numerical results are presented. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 47: 407–409, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21184

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