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Measurement of dielectric constant using a microwave microstrip ring resonator (MMRR) at 10 GHz irrespective of the type of overlay
Author(s) -
Sofin R. G. Sumesh,
Aiyer R. C.
Publication year - 2005
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.21066
Subject(s) - dielectric , microwave , resonator , microstrip , materials science , high κ dielectric , constant (computer programming) , overlay , resonance (particle physics) , dielectric resonator antenna , electronic engineering , optics , optoelectronics , physics , engineering , telecommunications , computer science , atomic physics , programming language
A new equation to measure the dielectric constant of materials using a microwave microstrip ring resonator (MMRR) at 10 GHz by empirically modifying the design equation of the effective dielectric constant of the system is proposed. Each material, with the proper size of interest, is overlaid on the MMRR and the change in resonance frequency caused by the change of effective dielectric constant of the system is measured, which depends on the dielectric constant, thickness, and type of overlay (complete or partial). No equations are available for obtaining the dielectric constant of the materials, which are used as partial overlays. The proposed equation can be used for both a complete and a crossed partial overlay. Validation of the equation is done using different dielectric materials and is in good agreement with the experimental results (within ±1%). This will be useful in applications such as grain‐moisture sensing using MMRR. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 47: 11–14, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21066