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A new free‐space method for measurement of electromagnetic parameters of biaxial materials at microwave frequencies
Author(s) -
Yin HongCheng,
Chao ZengMing,
Xu YanPing
Publication year - 2005
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.20905
Subject(s) - planar , transverse plane , reflection (computer programming) , optics , microwave , free space , coordinate system , system of measurement , space (punctuation) , plane (geometry) , transmission (telecommunications) , acoustics , materials science , principal axis theorem , physics , engineering , structural engineering , computer science , mathematics , geometry , electrical engineering , telecommunications , astronomy , programming language , operating system , computer graphics (images)
A free‐space method for the measurement of biaxial material is proposed in this paper. Four complex transverse constitutive parameters are directly computed from the reflection and transmission coefficients of a planar sample in free space for the normally incident plane wave with two polarizations. However, because of the extreme insensibility of the reflection and transmission coefficients versus the longitudinal constitutive parameters for thin planar biaxial materials, the correct reconstruction of longitudinal parameters cannot be accomplished by the free‐space method. Considering that the principal coordinate system (PCS) to characterize biaxial material possibly does not coincide with the measurement coordinate system (MCS), an approach to determine PCS is also presented to ensure practicability of this method. A measurement system has been set up to perform measurements of transverse parameters of biaxial material and the validity of this method is experimentally verified. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 46: 72–78, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20905