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Construction of refractive‐index profiles of graded‐index planar waveguides from effective indexes measured with different mode types and external refractive indexes
Author(s) -
Wei J.,
Xu X.F.,
Kang Z.H.,
Jiang Y.,
Ding Y.,
Gao J.Y.
Publication year - 2005
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.20818
Subject(s) - refractive index , planar , birefringence , optics , step index profile , refractive index profile , mode (computer interface) , waveguide , modal , microwave , normalized frequency (unit) , materials science , modal analysis , wavelength , characterization (materials science) , index (typography) , physics , computer science , acoustics , optical fiber , graded index fiber , telecommunications , fiber optic sensor , computer graphics (images) , phase locked loop , frequency synthesizer , phase noise , polymer chemistry , vibration , operating system , world wide web
A method is presented whereby the refractive‐index profile (RIP) can be reconstructed from sets of effective indexes measured with different mode types and external refractive indexes. Single‐mode waveguide RIP characterization can be easily realized using an index‐matching liquid at a single wavelength. This method is described and demonstrated via numerical examples and experimental results. The method has the advantages of convenient operation and accurate results for the characterization of graded‐index planar waveguides that support both mode types and contain known modal birefringence. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 45: 342–345, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20818