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Dynamic polarization‐dependent loss (DPDL) of planar‐waveguide‐based variable optical attenuators (VOAs)
Author(s) -
Zhang Zhiyi,
Xiao Gao Zhi,
Grover Chander P.
Publication year - 2004
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.20514
Subject(s) - attenuation , planar , interferometry , optics , microwave , waveguide , polarization (electrochemistry) , materials science , mach–zehnder interferometer , optical attenuator , thermal , optoelectronics , physics , engineering , telecommunications , optical fiber , computer science , chemistry , computer graphics (images) , fiber optic sensor , meteorology
We analyze the dynamic polarization‐dependent loss (DPDL) of planar‐waveguide‐based variable optical attenuators (VOAs). Our studies show that thermal stress is introduced in waveguides when heat is applied to achieve optical attenuation of Mach–Zehnder interferometer (MZI) coupler‐based VOAs made of silica, thus resulting in an unacceptable DPDL for such devices. The stress and its associated DPDL can be reduced significantly if two trenches are created along the waveguides. The DPDL can be further reduced to a negligible level by adopting a new VOA design based on straight waveguides and a silica–polymer hybrid structure. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 498–501, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20514