Measurement of complex permittivity of thin substrates using the TE 01n  resonant cavity | Zendy

Chen MingYan | Zendy; Yu JianPing | Zendy; Xu DeMing | Zendy

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Measurement of complex permittivity of thin substrates using the TE 01n resonant cavity

Author(s) -

Chen MingYan,

Yu JianPing,

Xu DeMing

Publication year - 2004

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.20276

Subject(s) - permittivity , microwave , resonant cavity , microwave cavity , optoelectronics , materials science , thin film , electrical engineering , electronic engineering , engineering , physics , optics , nanotechnology , telecommunications , dielectric , laser

An improved TE 01n resonant‐cavity method for measuring the complex permittivity of thin substrates is presented. The theory and the experimental results are described in this paper. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 274–277, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20276

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