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Measurement of complex permittivity of thin substrates using the TE 01n resonant cavity
Author(s) -
Chen MingYan,
Yu JianPing,
Xu DeMing
Publication year - 2004
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.20276
Subject(s) - permittivity , microwave , resonant cavity , microwave cavity , optoelectronics , materials science , thin film , electrical engineering , electronic engineering , engineering , physics , optics , nanotechnology , telecommunications , dielectric , laser
An improved TE 01n resonant‐cavity method for measuring the complex permittivity of thin substrates is presented. The theory and the experimental results are described in this paper. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 274–277, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20276