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A focused‐beam methodology for measuring microwave backscatter
Author(s) -
Schultz John W.,
Hopkins Edward J.,
Maloney James G.,
Kuster Eric J.,
Kesler Morris P.
Publication year - 2004
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.20252
Subject(s) - microwave , backscatter (email) , scattering , optics , classification of discontinuities , radar cross section , beam (structure) , range (aeronautics) , radar , computational physics , enhanced data rates for gsm evolution , x band , diffraction , materials science , physics , engineering , mathematics , telecommunications , mathematical analysis , composite material , quantum mechanics , wireless
A methodology is developed to determine the microwave backscatter from inhomogeneous materials and structures using a free‐space focused‐beam apparatus. This quantitative method determines the scattering coefficient for inhomogeneous surfaces and echo width for linear discontinuities. Measured data from a random rough surface are compared to compact radar cross‐section (RCS) range measurements, scatter data from a periodic array are compared to numerical simulations, and edge‐diffraction measurements are compared to model calculations. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 201–205, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20252