A focused‐beam methodology for measuring microwave backscatter | Zendy

Schultz John W. | Zendy; Hopkins Edward J. | Zendy; Maloney James G. | Zendy; Kuster Eric J. | Zendy; Kesler Morris P. | Zendy

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A focused‐beam methodology for measuring microwave backscatter

Author(s) -

Schultz John W.,

Hopkins Edward J.,

Maloney James G.,

Kuster Eric J.,

Kesler Morris P.

Publication year - 2004

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.20252

Subject(s) - microwave , backscatter (email) , scattering , optics , classification of discontinuities , radar cross section , beam (structure) , range (aeronautics) , radar , computational physics , enhanced data rates for gsm evolution , x band , diffraction , materials science , physics , engineering , mathematics , telecommunications , mathematical analysis , composite material , quantum mechanics , wireless

A methodology is developed to determine the microwave backscatter from inhomogeneous materials and structures using a free‐space focused‐beam apparatus. This quantitative method determines the scattering coefficient for inhomogeneous surfaces and echo width for linear discontinuities. Measured data from a random rough surface are compared to compact radar cross‐section (RCS) range measurements, scatter data from a periodic array are compared to numerical simulations, and edge‐diffraction measurements are compared to model calculations. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 201–205, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20252

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