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A method for the determination of a distributed FET noise model based on matched‐source noise‐figure measurements
Author(s) -
Maya M. C.,
Lázaro A.,
Pradell L.
Publication year - 2004
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.20099
Subject(s) - noise (video) , noise figure , microwave , electronic engineering , electrical engineering , engineering , acoustics , computer science , physics , telecommunications , artificial intelligence , cmos , image (mathematics) , amplifier
A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise‐correlation matrix of an elemental section of the device from the device's noise figure, measured for only one source‐impedance state at a number of frequency points. Experimental results up to 40 GHz are given. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 221–225, 2004; 2004; Published online in Wiley InterScience (www.interscience.wiley.com) DOI 10.1002/mop.20099