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Edge‐based finite‐element analysis of the field patterns in V‐shaped microshield line
Author(s) -
Lu Mai,
Leonard Paul J.
Publication year - 2004
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.20041
Subject(s) - microwave , finite element method , dielectric , extremely high frequency , transmission line , enhanced data rates for gsm evolution , field (mathematics) , line (geometry) , electrical engineering , engineering , electronic engineering , substrate (aquarium) , optics , materials science , acoustics , optoelectronics , physics , telecommunications , structural engineering , geometry , mathematics , geology , oceanography , pure mathematics
In this paper, field patterns in V‐shaped microshield transmission line are calculated by using the edge‐based finite element method. The dependence of the field patterns upon the thickness of metallic signal strip and the dielectric constant of dielectric substrate is presented. The figures in this paper have important values in the design of microshield lines in microwave and millimeter‐wave integrated circuits. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 43–47, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20041