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Dielectric loss of multilayer coupled microstrip line using SLR formulation
Author(s) -
Verma A. K.,
Bhupal A.
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.1359
Subject(s) - microstrip , microwave , dielectric , line (geometry) , materials science , range (aeronautics) , dielectric loss , reduction (mathematics) , computational physics , physics , optics , electronic engineering , optoelectronics , acoustics , engineering , telecommunications , mathematics , geometry , composite material
The single‐layer reduction (SLR) formulation is presented to compute the dielectric loss of even–odd modes of a multilayer coupled microstrip line. Results are compared against the results of full‐wave analysis with a maximum deviation of 2% for the wide range of parameters. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 31: 65–67, 2001.