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Investigation of the performance of the resistive voltage source used for the FDTD analysis of microstrip circuits
Author(s) -
Zhao An Ping,
Alinikula Petteri
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.1320
Subject(s) - microstrip , resistive touchscreen , finite difference time domain method , microwave , ground plane , voltage , voltage source , electrical impedance , characteristic impedance , electronic circuit , transmission line , electronic engineering , line (geometry) , input impedance , electrical engineering , engineering , physics , optics , telecommunications , mathematics , geometry , antenna (radio)
In this paper, the performance of the resistive voltage source (RVS) model used for the FDTD analysis of microstrip circuits is evaluated. It is found that, when the actual physical impedance of a microstrip line is used for assigning a constant value of R s into the corresponding electric nodes in the RVS region, the model often induces quite large reflections. Detailed numerical investigations indicate that the performance of the RVS model can be greatly enhanced when the effective impedance (which is determined by examining the maximum value of the calculated voltage between the strip line and the ground plane), instead of the physical impedance, of the microstrip line is used for the RVS model. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 378–381, 2001.