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A modified expression for determining the wall thickness of monolithic half‐wave radomes
Author(s) -
Sunil S.,
Venu K. S.,
Vaitheeswaran S. M.,
Raveendranath U.
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.1311
Subject(s) - radome , optics , materials science , microwave , dissipation factor , angle of incidence (optics) , lossy compression , polarization (electrochemistry) , context (archaeology) , tangent , engineering , dielectric , physics , geometry , optoelectronics , mathematics , electrical engineering , telecommunications , geology , paleontology , statistics , chemistry , antenna (radio)
A comparison of the wall thickness for a monolithic half‐wave radome at different incidence angles is made by considering the loss tangent of the material used. It is seen that, for large incidence angles and for moderately low‐loss radome materials, the computed wall thickness is different from the values obtained by neglecting the loss tangent of the material. The above context seems to be important, particularly for variable thickness radomes for aerospace applications where the thickness from nose to base varies with the angle of incidence and angle of polarization so as to achieve the optimum design of the radome. An expression for computing the wall thickness is given which is valid for both moderately lossy and very low‐loss radome materials. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 350–352, 2001.