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Quick derivation of high‐power thermal resistance values of HBTs using an existing measurement technique and a theoretical formula
Author(s) -
Tan C. L.,
Hui P.,
Yan Beiping,
Wang Hong,
Zheng Haiqun,
Yang Hong,
Radhakrishnan K.
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.1292
Subject(s) - thermal resistance , thermal , power (physics) , microwave , transformation (genetics) , value (mathematics) , mathematics , materials science , electrical engineering , engineering , physics , thermodynamics , telecommunications , statistics , chemistry , biochemistry , gene
Abstract A method is presented for the quick derivation of high‐power thermal resistance values using an existing measurement technique and a theoretical formula. It first derives the low‐power thermal resistance value, and then substitutes this value into the general form for the dependence of thermal resistance derived using the Kirchhoff transformation. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 287–289, 2001.

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