Quick derivation of high‐power thermal resistance values of HBTs using an existing measurement technique and a theoretical formula | Zendy

Tan C. L. | Zendy; Hui P. | Zendy; Yan Beiping | Zendy; Wang Hong | Zendy; Zheng Haiqun | Zendy; Yang Hong | Zendy; Radhakrishnan K. | Zendy

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Quick derivation of high‐power thermal resistance values of HBTs using an existing measurement technique and a theoretical formula

Author(s) -

Tan C. L.,

Hui P.,

Yan Beiping,

Wang Hong,

Zheng Haiqun,

Yang Hong,

Radhakrishnan K.

Publication year - 2001

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.1292

Subject(s) - thermal resistance , thermal , power (physics) , microwave , transformation (genetics) , value (mathematics) , mathematics , materials science , electrical engineering , engineering , physics , thermodynamics , telecommunications , statistics , chemistry , biochemistry , gene

A method is presented for the quick derivation of high‐power thermal resistance values using an existing measurement technique and a theoretical formula. It first derives the low‐power thermal resistance value, and then substitutes this value into the general form for the dependence of thermal resistance derived using the Kirchhoff transformation. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 287–289, 2001.

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