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Quick derivation of high‐power thermal resistance values of HBTs using an existing measurement technique and a theoretical formula
Microwave And Optical Technology LettersPeer ReviewedTan C. L. +62001Journals
A method is presented for the quick derivation of high‐power thermal resistance values using an existing measurement technique and a theoretical formula. It first derives the low‐power thermal resistance value, and then substitutes this value into the general form for the dependence of thermal resistance derived using the Kirchhoff transformation. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 287–289, 2001.
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