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An accurate calculation of microstrip step discontinuities' three sets of lengths for the transverse‐resonance technique by the method of lines
Author(s) -
Zakriti Alia,
Essaaidi Mohamed
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.1259
Subject(s) - classification of discontinuities , microstrip , transverse plane , microwave , resonance (particle physics) , convergence (economics) , engineering , electronic engineering , mathematical analysis , physics , acoustics , mathematics , structural engineering , telecommunications , atomic physics , economics , economic growth
In this paper, a numerical study is carried out in order to establish systematic convergence criteria for the method of lines. These criteria allow an optimum determination of microstrip step discontinuities' three sets of lengths, that are needed to determine the S ‐parameters of the considered structure by the transverse‐resonance technique. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 181–185, 2001.