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Analysis of random grating period and amplitude errors in ultra‐thin long‐period grating
Author(s) -
Chung KunWook,
Yin Shizhuo
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.1258
Subject(s) - grating , optics , ultrasonic grating , blazed grating , period (music) , materials science , amplitude , holographic grating , diffraction grating , optoelectronics , physics , acoustics
The effects of random fabrication errors on an ultra‐thin long‐period grating are numerically investigated. The influences of the random grating period and random amplitude nodes on an optical bandpass filter based on an ultra‐thin long‐period grating are introduced. It is found that the random period errors present severe degradation of the spectral performance of the ultra‐thin long‐period grating. The coupling intensity of the ultra‐thin long‐period grating decays exponentially with even small grating period noises. Our simulation results may help manufacturers to analyze the quality of fabricated long‐period gratings and to point out future improvement directions. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 178–181, 2001.