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Frequency dependence of dielectric constant of construction materials in microwave and millimeter‐wave bands
Author(s) -
Cuiñas Iñigo,
Pugliese JeanPierre,
Hammoudeh Akram,
García Sánchez Manuel
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.1238
Subject(s) - microwave , dielectric , extremely high frequency , millimeter , reflection (computer programming) , materials science , constant (computer programming) , optics , computational physics , electromagnetic radiation , physics , optoelectronics , quantum mechanics , computer science , programming language
Results of experiments made to characterize the electromagnetic properties of typical building materials at 5.8 and 62.4 GHz are presented and compared. Transmission and reflection coefficients were measured as functions of the angle of incidence. A multiple successive internal reflection model was developed and used to estimate the dielectric constants by comparing measured and predicted values. It has been shown that, at a given frequency, the type of material used determines the value of its dielectric constant. The variation of the value of this constant with frequency does not necessarily follow the same trend for different materials. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 123–124, 2001.