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A method for characterizing coplanar waveguide‐to‐microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobes
Author(s) -
Maya M. C.,
Lázaro A.,
DePaco P.,
Pradell L.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.11222
Subject(s) - coplanar waveguide , microstrip , microwave , transmission line , materials science , optoelectronics , electronic engineering , engineering , electrical engineering , telecommunications
This paper presents a method for characterizing coplanar waveguide‐to‐microstrip (CPW‐M) transitions by using on‐wafer coplanar (CPW) microprobes. It is based on extracting the transmission matrix of the CPW‐M transition from the measurement of the S parameters of two microstrip transmission lines of different lengths, each of which includes two CPW‐M transitions. To verify the proposed method, the S parameters of a zero‐length line, which is composed of two CPW‐M transitions (“thru” connection) and has not been used in the transition characterization, are measured up to 40 GHz and are compared to those extracted and obtained from electromagnetic simulations. The method is applied to the measurement of a microstrip coupled‐line filter embedded in CPW‐M transitions. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 373–378, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11222