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Relationship between root‐mean‐square and peak‐to‐peak jitter measurements
Author(s) -
Babić Dubravko,
Plombon John
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.11204
Subject(s) - jitter , root mean square , oscilloscope , square root , mean square , square (algebra) , mathematics , microwave , statistics , electronic engineering , electrical engineering , physics , computer science , engineering , telecommunications , geometry , voltage
The statistical relationship between peak‐to‐peak and root‐mean‐square (RMS) measurements of random and deterministic jitter is discussed. An analytic expression relating the two quantities is derived for normally distributed random jitter. This work is applicable to a production test of electronic or optical components that uses sampling oscilloscopes for jitter characterization. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 323–326, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11204