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Bias‐dependence of FET intrinsic noise sources, determined with a quasi‐2D model
Author(s) -
Lázaro A.,
Maya M. C.,
Pradell L.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.11202
Subject(s) - microwave , noise (video) , physics , computational physics , work (physics) , statistical physics , electronic engineering , engineering , quantum mechanics , computer science , artificial intelligence , image (mathematics)
The bias‐dependence of microwave‐FET intrinsic noise sources in their hybrid configuration is theoretically determined, using a new quasi‐2D (Q‐2D) physical model based on Thornber's current equation 8. It is shown that the correlation coefficient cannot be neglected, in agreement with empirical work in the literature. Experimental verification using noise‐parameter measurements up to 26 GHz is presented. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 317–319, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11202