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Near‐field imaging by negative permittivity media
Author(s) -
Lu W. T.,
Sridhar S.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.11191
Subject(s) - permittivity , slab , electric field , microwave , optics , lens (geology) , wavelength , physics , wavenumber , field (mathematics) , near and far field , materials science , optoelectronics , dielectric , mathematics , quantum mechanics , geophysics , pure mathematics
The imaging of the near field by a slab of negative permittivity medium is discussed. The performance of this flat lens is limited by the working wavenumber k 0 and the slab thickness d . For k 0 d ≪ 0.937, the resolution of the flat lens can be smaller than the wavelength and depends logarithmically on 1/ k 0 d . The electric field is finite everywhere, but will diverge algebraically as one reduces k 0 d → 0. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 282–286, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11191
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