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Determination of conductor loss of multilayer‐coupled microstrip lines for CAD application
Author(s) -
Verma A. K.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.11076
Subject(s) - conductor , microstrip , skin effect , microwave , inductance , fourier domain , electrical conductor , line (geometry) , materials science , electronic engineering , engineering , optics , optoelectronics , topology (electrical circuits) , fourier transform , electrical engineering , physics , mathematical analysis , mathematics , geometry , telecommunications , composite material , voltage
By modifying and adopting the incremental inductance rule, in association with the variational method in the Fourier domain, and using the single layer (SLR) formulation, we present a fast and accurate method to compute the conductor loss of a multilayer‐coupled microstrip line with and without shield. The accuracy of the method has been tested against several full‐wave methods. The conductor loss of many useful structures is compared. The method is valid for conductor thickness t > 1.11 skin depth. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 409–415, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11076