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Reflection and anomalous behavior of refractive index in defect photonic band gap structure
Author(s) -
Srivastava Sanjeev K.,
Ojha S. P.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.11041
Subject(s) - refractive index , photonic crystal , reflector (photography) , optics , reflection (computer programming) , materials science , slab , broadband , reflectivity , microwave , wavelength , band gap , optoelectronics , photonics , layer (electronics) , physics , nanotechnology , light source , quantum mechanics , geophysics , computer science , programming language
This paper describes the reflectivity properties of layer‐by‐layer‐based photonic band gap (PBG) structures with a defect in their normal structures. The defect is created by the removal of a single material slab. To calculate reflectivity, we use a 2 × 2 matrix formulation. The defective PBG structure gives nearly 100% reflections in the near‐infrared region in addition to some parts of the visible region of the wavelengths for all possible angles, and thus acts as broadband reflector. Also, we study the anomalous behavior of the refractive index in these structures and find that the effective refractive index n eff ≪ 1 nears the band edges. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 293–297, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11041