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Effect of ESD injection locations on induced noise inside a shielded enclosure
Author(s) -
Chan K. H.,
Fung L. C.,
Leung S. W.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.11015
Subject(s) - enclosure , shielded cable , emi , electrostatic discharge , electromagnetic interference , electrical engineering , noise (video) , acoustics , electromagnetic shielding , engineering , microwave , voltage , conducted electromagnetic interference , interference (communication) , electronic engineering , physics , telecommunications , computer science , channel (broadcasting) , artificial intelligence , image (mathematics)
Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI). The radiated EMI penetrates through the apertures on the enclosure and then couples to the circuitries inside the enclosure. This may cause malfunction and signal errors to the circuitries. In this paper, an experimental investigation on the effects of induced noise level caused due to different injection locations of ESD on the metallic enclosure with different aperture sizes is carried out. Results show that the induced voltage is highly sensitive to injection location of ESD. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 203–206, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11015