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Direct near‐field antenna testing and fault diagnosis by a silicon‐probe‐based optical sensing technique
Author(s) -
Massa R.,
Panariello G.,
Rendina I.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10981
Subject(s) - microwave , antenna (radio) , fault (geology) , field (mathematics) , near and far field , field intensity , engineering , electronic engineering , electrical engineering , optics , computer science , physics , telecommunications , geology , nuclear magnetic resonance , mathematics , seismology , pure mathematics
A non‐perturbing, fast, low‐cost probe for near‐field measurements is presented in this paper. The new sensing technique's capabilities in antenna fault diagnosis and direct measurement of field intensity distribution at subwavelength distance from the sources are demonstrated by test measurement on different microwave antennas and applicators. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 95–98, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10981