Characterization of polypropylene thin‐film microstrip lines at millimeter and submillimeter wavelengths | Zendy

Nagel M. | Zendy; Dekorsy T. | Zendy; Brucherseifer M. | Zendy; Haring Bolívar P. | Zendy; Kurz H. | Zendy

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Characterization of polypropylene thin‐film microstrip lines at millimeter and submillimeter wavelengths

Author(s) -

Nagel M.,

Dekorsy T.,

Brucherseifer M.,

Haring Bolívar P.,

Kurz H.

Publication year - 2001

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.1096

Subject(s) - microstrip , materials science , microwave , attenuation , dielectric , millimeter , optoelectronics , polypropylene , optics , extremely high frequency , permittivity , dispersion (optics) , thin film , wavelength , composite material , telecommunications , physics , engineering , nanotechnology

We report on the characteristics of thin‐film microstrip lines with adhesive polypropylene tape as dielectric. The attenuation and dispersion have been measured in a frequency range between 30 and 800 GHz by electro‐optical sampling. A 31‐μm‐wide PP microstrip line exhibits a low attenuation of 0.09 dB/mm and an effective permittivity ε r , eff of 1.85, both at 30 GHz. Both the excellent dielectric properties as well as the high planarity appear very attractive for future waveguide structures. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 29: 97–100, 2001.

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