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Width and thickness effects of dielectric overlay on even and odd mode resonance frequency of microstrip ring resonator
Author(s) -
Jacob Julie,
Nuangnum Chote,
Aiyer R. C.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10952
Subject(s) - microwave , resonator , microstrip , resonance (particle physics) , dielectric , materials science , overlay , perturbation (astronomy) , split ring resonator , optics , nonlinear system , strips , optoelectronics , electrical engineering , physics , engineering , atomic physics , telecommunications , composite material , computer science , quantum mechanics , programming language
The effect of perturbation on even‐ and odd‐mode resonance frequencies of a microstrip ring resonator (MRR) is studied. Overlay of alumina strips with variable width (1 mm to 4 mm) and thickness (0.635 mm to 3.175 mm) are used to perturb the MRR. The change in even‐ and odd‐mode resonance frequencies, due to width of the overlay, is found to be nonlinear. Odd‐mode frequency is observed to be independent of perturbation due to the thickness of the overlay. Even‐mode frequency variations tend to saturate for thickness greater than about four times the substrate height. Based on the experimental results, empirical equations for even‐ and odd‐mode resonance frequencies are reported. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 37: 465–470, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10952