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Self‐scaling properties of the reflection coefficient of Cantor prefactal multilayers
Author(s) -
Chiadini F.,
Fiumara V.,
Pinto I. M.,
Scaglione A.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10912
Subject(s) - reflection coefficient , cantor set , reflection (computer programming) , scaling , microwave , dielectric , set (abstract data type) , mathematical analysis , representation (politics) , mathematics , matrix (chemical analysis) , optics , physics , materials science , pure mathematics , geometry , computer science , quantum mechanics , politics , law , political science , composite material , programming language
We highlight the self‐similar features of the frequency‐dependent (absolute) reflection coefficient of a dielectric Cantor prefractal obtained by applying the well‐known Cantor‐set construction to the optical (rather than physical) layer lengths. The referred properties are first obtained using an exact characteristic matrix representation of the reflection coefficient and then resorting to an (accurate) small‐reflection approximation. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 37: 339–343, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10912