z-logo
Premium
Experimental results for a CW‐mode optically controlled microwave switch on a silicon‐based coplanar waveguide
Author(s) -
Lee Sangil,
Kuga Yasuo,
Mullen Ruth Ann
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10737
Subject(s) - insertion loss , microwave , coplanar waveguide , materials science , optoelectronics , waveguide , silicon , etching (microfabrication) , substrate (aquarium) , optics , nanotechnology , telecommunications , engineering , physics , oceanography , layer (electronics) , geology
Abstract A CW‐mode optically controlled microwave switch (CW‐mode OMS) on a coplanar waveguide (CPW) for both a standard and a new design with carrier‐confinement structure is investigated. We experimentally show that it may not be possible to obtain less than 7 dB of insertion loss with the standard OMS, and the carrier diffusion limits the improvement of insertion loss in CW‐mode operation. We present a new design with a carrier‐confinement structure with silicon (Si) substrate etching to confine the optically generated free‐carriers. Less than 2 dB of insertion loss is obtained with the new carrier‐confined OMS. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 36: 257–262, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10737

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here