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Study on reduction in radiated emissions from PCB using test LSI
Author(s) -
Haga Satoru,
Nakano Ken,
Sudo Toshio,
Hashimoto Osamu
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10732
Subject(s) - microwave , engineering , electrical engineering , ferrite (magnet) , reduction (mathematics) , mode (computer interface) , electronic engineering , electronic circuit , computer science , telecommunications , geometry , mathematics , operating system
Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI‐mounted area has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 36: 238–242, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10732