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Electromagnetic scattering from a thick circular aperture
Author(s) -
Lee Haeng S.,
Eom Hyo J.
Publication year - 2003
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10728
Subject(s) - scattering , near and far field , microwave , optics , aperture (computer memory) , polarization (electrochemistry) , electromagnetic radiation , physics , plane wave , computation , radiation , circular polarization , acoustics , computer science , chemistry , algorithm , quantum mechanics , microstrip
Electromagnetic scattering from a circular aperture in a thick conducting plane is analyzed. Numerical computations are performed to evaluate the near and far zone radiation fields in terms of the aperture geometry and incident polarization state. A salient difference in the near‐zone field behavior between TM and TE wave incidences is discussed. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 36: 228–231, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10728