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Data reduction in the NF‐FF transformation with bi‐polar scanning
Author(s) -
D'Agostino F.,
Gennarelli C.,
Riccio G.,
Savarese C.
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10662
Subject(s) - transformation (genetics) , polar , microwave , reduction (mathematics) , field (mathematics) , representation (politics) , sampling (signal processing) , electronic engineering , electromagnetic field , stability (learning theory) , process (computing) , engineering , computer science , electrical engineering , algorithm , telecommunications , mathematics , physics , chemistry , geometry , filter (signal processing) , law , operating system , biochemistry , quantum mechanics , machine learning , political science , astronomy , politics , pure mathematics , gene
An efficient near‐field–far‐field transformation with bi‐polar scanning, which compensates for the effects of the measurement probe, is proposed in this paper. It is based on the theoretical results relevant to the nonredundant sampling representation of electromagnetic fields and, as a consequence, it requires a number of data—remarkably lower than that needed by the standard bi‐polar technique. Numerical examples assessing the accuracy and the stability of the far‐field reconstruction process are presented. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 36: 32–36, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10662