1.55‐μm surface‐illuminated monolithically integrated balanced metal semiconductor metal photodetectors and coplanar waveguide | Zendy

Safwat Amr M. E. | Zendy; Kim Junghwan | Zendy; Johnson William | Zendy; Walker Bobby | Zendy; Lee Chi H. | Zendy

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1.55‐μm surface‐illuminated monolithically integrated balanced metal semiconductor metal photodetectors and coplanar waveguide

Author(s) -

Safwat Amr M. E.,

Kim Junghwan,

Johnson William,

Walker Bobby,

Lee Chi H.

Publication year - 2002

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.10393

Subject(s) - photodetector , coplanar waveguide , optoelectronics , microwave , waveguide , intermodulation , materials science , optics , semiconductor , detector , noise (video) , physics , telecommunications , engineering , cmos , computer science , amplifier , artificial intelligence , image (mathematics)

Two metal–semiconductor–metal (MSM) photodetectors are integrated monolithically with a coplanar waveguide transmission line to form a 1.55‐μm surface‐illuminated balanced photodetector. Illuminating the device with CW and taking the difference, the relative intensity noise (RIN) is suppressed by 9–10 dB. In balanced detection, a 7‐dB enhancement in the intermodulation term compared to single detector is achieved. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 125–130, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10393

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