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1.55‐μm surface‐illuminated monolithically integrated balanced metal semiconductor metal photodetectors and coplanar waveguide
Author(s) -
Safwat Amr M. E.,
Kim Junghwan,
Johnson William,
Walker Bobby,
Lee Chi H.
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10393
Subject(s) - photodetector , coplanar waveguide , optoelectronics , microwave , waveguide , intermodulation , materials science , optics , semiconductor , detector , noise (video) , physics , telecommunications , engineering , cmos , computer science , amplifier , artificial intelligence , image (mathematics)
Two metal–semiconductor–metal (MSM) photodetectors are integrated monolithically with a coplanar waveguide transmission line to form a 1.55‐μm surface‐illuminated balanced photodetector. Illuminating the device with CW and taking the difference, the relative intensity noise (RIN) is suppressed by 9–10 dB. In balanced detection, a 7‐dB enhancement in the intermodulation term compared to single detector is achieved. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 125–130, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10393