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New algorithms of the TSM and TOM methods for calibrating microwave test fixtures
Author(s) -
Zhu Ning Hua,
Chen Zhen Yu,
Wang You Lin
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10363
Subject(s) - microwave , bandwidth (computing) , algorithm , electronic engineering , computer science , engineering , telecommunications
Based on the conventional through‐short‐match (TSM) method, an improved TSM method has been proposed in this Letter. This method gives an analytical solution and has almost all the advantages of conventional TSM methods. For example, it has no phase uncertainty and no bandwidth limitation. The experimental results show that the accuracy can be significantly improved with this method. The proposed theory can be applied to the through‐open‐match (TOM) method. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 26–31, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10363