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Analysis of interconnect lines using the finite‐difference time‐domain (FDTD) method
Author(s) -
Farahat Nader,
ElRaouf Hany E. Abd,
Mittra Raj
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10356
Subject(s) - finite difference time domain method , microwave , interconnection , microstrip , perfectly matched layer , electronic engineering , finite difference method , time domain , coupling (piping) , significant difference , computer science , engineering , materials science , physics , mathematics , optics , mathematical analysis , telecommunications , mechanical engineering , statistics , computer vision
In this Letter the coupling effect (cross talk) in parallel microstrip interconnects is analyzed with the use of the finite‐difference–time‐domain (FDTD) method. The interconnects are terminated either by lumped elements or by a perfectly matched layer (PML), and the results obtained from these two methods are compared. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 6–9, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10356