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Very high broadband electromagnetic characterization method of film‐shaped materials using coplanar
Author(s) -
Hinojosa J.,
Lmimouni K.,
Lepilliet S.,
Dambrine G.
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10319
Subject(s) - coplanar waveguide , broadband , microwave , isotropy , materials science , dielectric , substrate (aquarium) , characterization (materials science) , computation , optoelectronics , optics , engineering , physics , computer science , telecommunications , nanotechnology , oceanography , algorithm , geology
A very high broadband method for determining the electromagnetic properties of isotropic film‐shaped materials, which uses coplanar lines as cells, is presented. The material tested is the coplanar line substrate. The complex properties are computed from S‐parameter measurements of coplanar cells propagating the dominant mode and using analytical relationships, which decrease the computation time. Vector network analyzers and high‐quality on‐coplanar test fixtures are used for the measurement bench. Measurements for several dielectric materials in the 0.05–110 GHz frequency range show good agreements between measured and predicted data. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 352–355, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10319