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Statistical construction of accurate CAD models using measured data
Author(s) -
Naishadham Krishna,
Leiker William
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10284
Subject(s) - component (thermodynamics) , cad , construct (python library) , electronic engineering , microwave , computer aided design , computer science , simple (philosophy) , statistical model , electronic circuit , electronic circuit simulation , circuit design , engineering , engineering drawing , electrical engineering , artificial intelligence , operating system , telecommunications , philosophy , physics , epistemology , thermodynamics , programming language
Component models available in CAD software do not consider the statistical variation and the layout‐ or package‐specific parasitic effects of components. Because of the complexity of device packages, the well‐established EM simulation alternative can only be applied to relatively simple circuits. This Letter presents a methodology to construct statistically a representative component model from a measured database, and show how such a model can be used in a circuit simulator for effective circuit design. All the parasitic effects of the circuit components are incorporated through measurements. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 233–238, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10284