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Extraction of lumped‐element equivalent‐circuit models of microstrip discontinuities using the finite‐difference time‐domain method
Author(s) -
Farahat Nader,
Yu Wenhua,
Mittra Raj
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10254
Subject(s) - finite difference time domain method , classification of discontinuities , microstrip , discontinuity (linguistics) , admittance parameters , microwave , equivalent circuit , electronic engineering , matrix (chemical analysis) , engineering , finite element method , time domain , mathematical analysis , electrical engineering , mathematics , computer science , structural engineering , physics , materials science , telecommunications , optics , voltage , composite material , computer vision
This Letter presents a method for extracting the lumped‐element equivalent‐circuit models of microstrip discontinuities by using the finite‐difference–time‐domain (FDTD) method. The cascading properties of the ABCD matrix are used to de‐embed the attachment lines, leading to the two‐port matrix of the discontinuity section alone. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 132–134, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10254