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Design of a tapered impedance‐matching line using inverse scattering
Author(s) -
Song Choongho,
Lee Sangseol
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10188
Subject(s) - reflection coefficient , impedance matching , electrical impedance , characteristic impedance , microwave , passband , scattering parameters , matching (statistics) , reflection (computer programming) , optics , quarter wave impedance transformer , electronic engineering , acoustics , mathematics , physics , computer science , engineering , electrical engineering , telecommunications , damping factor , band pass filter , statistics , programming language
A new design method for a tapered impedance‐matching line is proposed. The accurate characteristic impedance profile of the desired matching line is obtained through the accurate profile inversion of a virtual dielectric medium which is equivalent to the matching line in view of the reflection characteristic. Then, the matching line is synthesized according to the characteristic impedance profile. The method can be applied to design impedance‐matching lines with arbitrary passband characteristics without any equivalent‐circuit analysis. In this method, the inevitable errors in the method using the time‐domain reflection coefficient can be avoided by using the frequency‐domain reflection coefficient. © 2002 John Wiley & Sons, Inc. Microwave Opt Technol Lett 32: 393–396, 2002.