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An iterative multiresolution approach for microwave imaging applications
Author(s) -
Caorsi Salvatore,
Donelli Massimo,
Franceschini Davide,
Massa Andrea
Publication year - 2002
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10175
Subject(s) - microwave imaging , microwave , iterative method , iterative and incremental development , algorithm , iterative reconstruction , process (computing) , dielectric , computer science , resolution (logic) , domain (mathematical analysis) , optics , mathematics , physics , computer vision , artificial intelligence , telecommunications , mathematical analysis , software engineering , optoelectronics , operating system
In this letter, an iterative method for microwave imaging applications is presented. According to an iterative multistep procedure, the object under test is located and successively reconstructed with an increasing accuracy. At each step of the multistep process, the center and the area (to which the scatterer belongs) of a reduced investigation domain are estimated. Then a finer resolution for the unknown dielectric profile is used only for the reduced searching region. The process is repeated until a “stationary” reconstruction is reached. The proposed approach is preliminarily assessed by means of data synthetically generated concerning a dielectric two‐dimensional scatterer. © 2002 John Wiley & Sons, Inc. Microwave Opt Technol Lett 32: 352–356, 2002.