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Properties of high‐ε r microstrip lines
Author(s) -
Crute John R.
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10020
Subject(s) - microstrip , microwave , dielectric , materials science , characteristic impedance , high κ dielectric , electrical impedance , ceramic , electric power transmission , propagation constant , electrical engineering , optoelectronics , electronic engineering , engineering , telecommunications , composite material
High‐dielectric‐constant (high‐ε r ) ceramic materials provide opportunities for developing ultra‐miniaturized microstrip circuits. This paper investigates the properties of high‐ε r microstrip transmission lines on (Zr, Sn)TiO 4 (ε r =37) and BaO–PbO–Nd 2 O 3 –TiO 2 (ε r =88) substrates. An electromagnetic (EM) field solver is used to determine the frequency‐dependent characteristic impedance and effective dielectric constant of a range of microstrip lines up to 5 GHz. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 31: 313–314, 2001.