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Equivalent transmission‐line model for optically controlled microstrip slow‐wave structures
Author(s) -
Bhadauria Avanish,
Sharma Enakshi Khular,
Verma Anand K.
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.10015
Subject(s) - transmission line , microstrip , equivalent circuit , inductance , capacitance , attenuation , microwave , skin effect , physics , optics , dielectric , line (geometry) , acoustics , electronic engineering , materials science , optoelectronics , engineering , electrical engineering , voltage , mathematics , geometry , quantum mechanics , electrode
This paper presents equivalent transmission‐line circuit models for an optically controlled microstrip slow‐wave MIS structure which are valid over all regions of operation, namely, lossy dielectric, slow wave, and skin effect. The models take into account both capacitance and inductance due to the skin effect. The results for the phase constant (slowing factor) and attenuation by the equivalent‐circuit models compare well with those obtained by an exact wave analysis. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 31: 292–298, 2001.