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The effect of contact degradation on electromagnetic radiation in electronic devices
Author(s) -
Li Qingya,
Gao Jinchun,
Flowers George T.
Publication year - 2020
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.22063
Subject(s) - cable gland , electromagnetic field , acoustics , leakage (economics) , radiation , signal (programming language) , electromagnetic environment , antenna (radio) , near and far field , electromagnetic radiation , materials science , time domain , electrical engineering , optics , physics , engineering , computer science , quantum mechanics , economics , computer vision , macroeconomics , programming language
Loose electrical connectors tend to increase electromagnetic radiation. In this current study, the effect of loose contacts on electromagnetic radiation is theoretically modeled and experimentally analyzed. An equivalent model was developed and a wire antenna model was built according to the physical dimensions of the connector to evaluate the radiated field in the time domain. Combining the expressions of the radiated fields and the transfer function of the test probe, the relationship between the input signal and the leakage voltage was obtained. The near field test method was used to measure the leakage signal caused by the loose contact. The tested results for a specific loose contact condition were consistent with the theoretical analysis.