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Improved approach using symmetric microstrip sensor for accurate measurement of complex permittivity
Author(s) -
Sun Haoran,
Tang Tao,
Du Guohong
Publication year - 2018
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.21258
Subject(s) - ground plane , materials science , permittivity , microstrip , dielectric , scattering parameters , sensitivity (control systems) , relative permittivity , capacitor , planar , optics , acoustics , optoelectronics , electronic engineering , antenna (radio) , computer science , telecommunications , physics , electrical engineering , engineering , computer graphics (images) , voltage
Abstract A novel symmetrical planar sensor based on splitter/combiner microstrip sections with a pair of interdigital capacitors (IDCs) and 2 complementary split ring resonators (CSRRs) structure is presented. A high sensitivity area to the dielectric property of surrounding materials has been established by locating IDC unit on the top‐plane while a rectangular CSRR structure etched out on the ground plane. The symmetrical circuit makes the sensitivity further improved to the introduction of sample to be tested because of the destruction of the symmetry. The complex permittivity of the dielectric samples has been evaluated from the actual experimental scattering parameters by using back propagation neural network techniques. The proposed methodology is validated by fabricating the sensor on Rogers5880 substrate and testing various standard dielectric samples viz. PVC, Glass epoxy, FR4, and Glass in C‐band. The measured complex permittivity of the test specimens is found to be in close agreement with their values available in literature with maximum error of <5%.