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Process and terminations variations aware stability criteria for microwave amplifiers
Author(s) -
Scotti Giuseppe,
Tommasino Pasquale,
Trifiletti Alessandro
Publication year - 2013
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.20696
Subject(s) - immittance , amplifier , microwave , stability (learning theory) , electronic engineering , process (computing) , computer science , process variation , cad , transistor array , engineering , engineering drawing , telecommunications , cmos , machine learning , operating system
Two novel process variations aware, necessary and sufficient conditions suitable for implementation in CAD optimizers are proposed to check amplifiers stability. Case studies are presented, showing that the new criteria allow robust amplifier design, under variation of active device immittance parameters in pre‐specified rectangular regions, due to manufacturing tolerances. © 2012 Wiley Periodicals, Inc. Int J RF and Microwave CAE 23: 619–626, 2013.