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Efficient characterization of EMC shielding in anisotropic high‐ T c superconducting devices for industrial applications
Author(s) -
Lamine Tounsi Mohamed,
Yagoub Mustapha C. E.
Publication year - 2012
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/mmce.20590
Subject(s) - electromagnetic shielding , anisotropy , superconductivity , microwave , materials science , lossy compression , electromagnetic compatibility , optoelectronics , dielectric , characterization (materials science) , engineering physics , electronic engineering , electrical engineering , condensed matter physics , composite material , computer science , physics , optics , engineering , telecommunications , nanotechnology , artificial intelligence
In this article, an efficient full‐wave‐mode algorithm has been developed to efficiently address industrial needs for rigorous characterization of electromagnetic compatibility shielding effects in anisotropic high‐temperature superconducting microwave devices on lossy anisotropic dielectric substrates in multilayer configuration. Finite thickness and conductivity as well as anisotropy of the superconducting films have been investigated. The proposed formulation uses the spectral domain dyadic Green's functions for stratified media. © 2011 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2012.